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• BIbTex format
  @article{
  title={Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs},
  author={Álvarez-Botero, G. and Torres-Torres, R. and Murphy-Arteaga, R.},
  journal={Microelectronics Reliability},
  year={2011},
  volume={51},
  number={2},
  pages={342-349},
  doi={},
  }
• RIS format (for Reference Manager, ProCite, EndNote)
  TY - JOUR
  T1 - Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs
  AU - Álvarez-Botero, G.
  AU - Torres-Torres, R.
  AU - Murphy-Arteaga, R.
  TI - Microelectronics Reliability
  PY - 2011
  VL - 51
  M1 - 2
  SP - 342-349
  DO -
  ER -
  
• RefWorks format
  RT Journal Article
  T1 Using S-parameter measurements to determine the threshold voltage, gain factor, and mobility degradation factor for microwave bulk-MOSFETs
  A1 Álvarez-Botero, G.
  A1 Torres-Torres, R.
  A1 Murphy-Arteaga, R.
  JF Microelectronics Reliability
  YR 2011
  VO 51
  IS 2
  SP 342-349
  DO