Journals

Modeling and parameter extraction of test fixtures for MOSFET on-wafer measurements up to 60 GHz


Authors

   Álvarez-Botero, G.; Torres-Torres, R.; Murphy-Arteaga, R. S.

Journal

   International Journal of RF and Microwave Computer-Aided Engineering
   Volume 23
   Issue 6
   Pages 655 to 661
   Year 2013


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Prof. Dr. Manuel López-Amo
Dpto de Ingeniería Eléctrica y Electrónica
Campus Arrosadia
Pamplona
Tel. +34 948 169055
Fax. + 34 948 169720
Contact by E-mail