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Conferences

Parameter extraction method for modelling SiGe HBTs using cold condition S-parameter measurements


Conference

   XVII International IBERCHIP Workshop

Pages

   1 to 4

Year

   2011

Place

   170 (Colombia)

Publishing house

   IBERCHIP

Publisher

   

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Prof. Dr. Manuel López-Amo
Dpto de Ingeniería Eléctrica y Electrónica
Campus Arrosadia
Pamplona
Tel. +34 948 169055
Fax. + 34 948 169720
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