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Conferences

Impact of multi-finger geometry on the extrinsic parasitic resistances of microwave MOSFETs


Conference

   IEEE MTT-S International Microwave Symposium (IMS2014)

Pages

   1 to 3

Year

   2014

Place

   840 (Estados Unidos de América)

Publishing house

   IEEE

Publisher

   

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Prof. Dr. Manuel López-Amo
Dpto de Ingeniería Eléctrica y Electrónica
Campus Arrosadia
Pamplona
Tel. +34 948 169055
Fax. + 34 948 169720
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