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XVII International IBERCHIP Workshop


Chapter title

   Parameter extraction method for modelling SiGe HBTs using cold condition S-parameter measurements

Pages

   1 to 4

Authors

   Alvarez Botero, Germán Andrés

Publishing house

   IBERCHIP

Publisher

   

Place

   Bogotá (Colombia)

Year

   2011

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Prof. Dr. Manuel López-Amo
Dpto de Ingeniería Eléctrica y Electrónica
Campus Arrosadia
Pamplona
Tel. +34 948 169055
Fax. + 34 948 169720
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