The instruments that permit to develop our activities and services are describe next:

Microstructural characterization

X Ray diffractometer. Model: Siemens Diffractometer D5000

The Siemens D5000 XRD system offers many advanced features of users who require additional axes, support for automatic generator control and/or compatibility with non-ambient thermal stages. The D5000 operates with fully independent control of each axis which allows for rocking curve analysis as well as grazing incidence scans to be performed.

The system includes:

• Single sample stage
• Full set of interchangeable aperture slits
• Integrated measuring electronics with a scintillation detector
• Fully Interlocked radiation housing
• Diffracted beam monochromator
• Variable anti-scatter and divergence slits
• Grazing incidence attachment (for thin films)
• Theta/Theta goniometer or Theta/2Theta goniometer
   

Polarized light optical microscopy with Normansky interferometric and heating cooling stage. Model:  BX51M. OLYMPUS

The Olympus BX51M offers a full product line-up for every purpose and even for special material science applications. Near-infrared light observations are possible with the same microscope body and reflected light illuminator. The Olympus BX51M provides great system versatility for reflected light materials science.  The microscope is equipped with a control temperature system where combining liquid nitrogen with resistance, the temperature of one platform can modify the temperature of the sample to observe in the microscope.

• Trinocular head
• Eyepieces 10x
• 5 Positions of nosepiece
• Objectives: UMPLANFL 5x, 10x, 20x, 50x, 100x
• Mechanical stage
• Coarse/Fine Focus
• Halogen Reflected Light
• Control temperature platform