Journals

EEL spectroscopic tomography: towards a new dimension in nanomaterials analysis


Authors

   Yedra, L.; Eljarrat, A.; Arenal, R.; Pellicer, E.; Cabo, M.; López-Ortega, A.; Estrader, M.; Sort, J.; Baró, M. D.; Estradé, S.; Peiró, F.

Journal

   Ultramicroscopy
   Volume 122
   Pages 12 to 18
   Year 2012


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Physical properties and applications of materials
Dr. Juan Jesús Beato-López

Departamento de Ciencias. Edificio Acebos
Campus Arrosadia
Pamplona
Tel. 948 169 581
Contact by E-mail