This research group uses well-equipped facilities that are built around four laboratories: the Optical Communications Lab, the Sensors Lab, the Photonics Lab, and the Teralab. The computing and simulation facilities include more than 50 high-end computers that run software for electrical (microwave) and lightwave devices design as well as optical networks and systems simulation. In terms of instrumentation, a wide variety of electrical and lightwave measurements are available. Novel devices and subsystems can also be fully characterised using the wide range of electrical and lightwave components in the labs.

The non-consumable equipment available from own contributions and other organizations is:

AFM INNOVA (Veeco Inc.)

Sample Size: 45mm x 45mm x 18mm Motorized Z stage: Z travel: 18mm, with pitch and tilt capability
Closed-Loop, Large Area Scanner: XY > 90μm, Z > 7.5μm
Open-Loop, Small Area Scanner: XY > 5μm, Z > 1.5μm
Noise Floor, Z: <50 pm RMS, typical imaging bandwidth
Closed-loop XY noise: <1.2 nm RMS, typical imaging bandwidth
Z-Linearizer noise: <200 pm RMS, typical imaging bandwidth
Open-loop XY drift <1nm/ min
Closed-loop XY drift <3nm/ min
Warm-up Time Open-loop: 15min
Electronics
20-bit DAC scan control, 8 x 100kHz +/- 10V ADCs
Digital force and position feedback, programmable and controllable through external signals
Integrated SW configurable signal access and routing
2 x Full digital lock-ins
Optics
On-axis, FOV 1.25mm - 0.25mm
5x motorized zoom, software controlled
<2μm resolution (0.75μm resolution with 50x)
10x objective (50x optional)
System Software: NanoDrive v8 real-time control & NanoScope Analysis included
AFM Modes
Standard: Contact Mode, TappingMode™, PhaseImaging™, LiftMode™,
Nano-Indentation, Force Spectroscopy, Scanning Tunneling Microscopy (STM).

Volver