2018 IEEE International Geoscience & Remote Sensing Symposium: proceedings: July 22-27, 2018, Valencia, Spain

Kapituluaren izenburua

   On the influence of spatial resolution in soil surface roughness characterization using Tls and Sfm techniques

Orrialdeak:

   3362 a 3365

Autoreak

   Álvarez Mozos, Jesús

Editorial

   IEEE

Argitaratzailea

   

Tokia

   Piscataway (Estados Unidos de América)

Urtea

   2018

Itzuli