On the influence of spatial resolution in soil surface roughness characterization using Tls and Sfm techniques
Congreso
2018 IEEE International Geoscience & Remote Sensing Symposium: proceedings: July 22-27, 2018, Valencia, Spain
Páginas
3362 a 3365
Año
2018
Lugar
840 (Estados Unidos de América)
Editorial
IEEE
Editor
Volver